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OmniScan SX hickness and Flaw Inspection Solutions

Olympus is proud to introduce the OmniScan® SX, a flaw detector that benefits from more than 20 years of phased array experience and shares the OmniScan DNA

OmniScan SX hickness and Flaw Inspection Solutions

For improved ease of use, the OmniScan SX features a new streamlined software interface displayed on an 8.4 in. (21.3 cm) touch screen. A single-group and non-modular instrument, the OmniScan SX is easy to operate and cost-effective for less demanding applications.

The OmniScan SX comes in two models: the SX PA and SX UT. The SX PA is a 16:64PR phased array unit, which, like the UT-only SX UT, is equipped with a conventional UT channel for pulse-echo, pitch-catch or TOFD inspection. Compared to the OmniScan MX2, the SX is 33% lighter and 50% smaller, offering an unprecedented level of portability for an OmniScan.

The OmniScan SX touch screen offers a full-screen mode option that maximizes visibility, essentially converting many menu functions into easy touch-screen operations. The intuitive interface provides smooth menu selection, zooming, gate adjustments, cursor movements, and text and value input. These, along with other premium integrated features, including easy-to-follow setup and calibration Wizards, a rapid refresh rate for both the S-scan and A-scan displays, and a fast pulse repetition frequency (PRF), make the OmniScan SX a highly efficient inspection tool.

The OmniScan SX is fully compatible with the extensive portfolio of Olympus scanners, probes and accessories, as well as with its dedicated software companions, NDT SetupBuilder and OmniPC. Combined, the complete family of software and hardware contributes to a streamlined and efficient inspection workflow, from design and setup to acquisition and analysis.

www.olympus-ims.com

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